Comparison of Various Scan-Chain Free Functional Testing for Secured Hardware Systems

Paper ID: EIJTEM_2017_4_2_1-4

Author's Name: R. Ananth Hari

Volume: 4

Issue: 2

Year: 2017

Page No: 1-4

Abstract:

Testing a circuit is one of the important strategies for circuits, where security is maintained. Scan Chain Test is a very efficient technique for testing the hardware .But when it is used in circuits where security is maintained, it can acts as a Gateway for the attackers to access secret keys. Security is an important constraint and has to be maintained, when we are performing Testing methods for secure hardware systems. Scan Chain Test is a very efficient technique for testing the hardware. But when it is used in circuits where security is maintained, it can acts as a Gateway for the attackers to access secret keys. Hence Builtin Self-test is widely used for secure testing, thereby security is maintained. This Built-in Self-Test is used to perform Testing for Fuzzy Extractor (FE) Block in which area overhead is reduced by repeatedly using the FE blocks. Scan chain free functional testing is the aim of the secure testing. Testing a circuit is one of the important strategies for circuits, where security is maintained. Scan Chain Test is a very efficient technique for testing the hardware .But when it is used in circuits where security is maintained, it can acts as a Gateway for the attackers to access secret keys

Keywords: Security, Built-in Self-Test, Fuzzy Extractor, Secure Testing.

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